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FS-70 series SERIES 378 — Microscope Unit for Semiconductor Inspection (378-187-2)

FS-70 SERIES SERIES 378

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Product Description

• Compact microscope unit equipped with an eyepiece observation section. Suitable for inspecting metal surfaces, semiconductors, liquid crystal substrates, resin, etc.
• A versatile microscope head typically used as an OEM product suitable for fitting to specialist machines, such as those designed for inspection and repair of semiconductor wafers using YAG (near-infrared, visible, near-ultraviolet, or ultraviolet) lasers*.
* The performance and safety of the laser-equipped system products is not guaranteed.
Applications: cutting, trimming, correcting, marking of semiconductor circuits / clearing & processing of thin films (insulation films), repairing (correcting failure) of liquid crystal color filters. Also suited for use as the optical observation section for a prober analyzing semiconductor failures.
• Usable in infrared optical systems*. Applications: internal observation of silicon systems; spectral characteristics analysis using infrared.
* An infrared source and infrared camera are necessary.
• Models supporting BF (Bright field), DF (Dark field), Polarization, and Differential Interference Contrast (DIC) are available.
• Koehler illumination equipped with an aperture diaphragm is provided as standard on the surface illumination optical system.
• The inwardly slanting turret and ultra-long working distance objective lens maintains the high operability under the microscope. Koehler illumination is equipped with the aperture diaphragm as standard on the surface illumination optical system.

Part Number
378-187-2
Part NumberPriceNameMinimum Order Qty.Volume DiscountDays to ShipDetailed Type Camera Mounting Direction Mass Objective, optional (for laser-cutting) Loading Tilt angle Optical pass ratio Protective filter Tube lens Applicable laser

฿ 999,999,999.00

FS-70 SERIES SERIES 378 1 Piece(s) 95 Day(s) FS70L4-SC-mount receptacle (with green filter switch)6.7kgM Plan UV13.9kgSwitchable type (Eyepiece/Tube = 100/0: 0/100)Built-in laser beam filter1X532/266nm

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Basic Information

Product Type Microscope Supplies Observed Image Erect image Illumination Reflective illumination for bright field (Koehler illumination, with aperture diaphragm) 12V 100W fiber-optics, stepless adjustment, light guide length: 1.5m
Objective (optional) M Plan Apo, / M Plan Apo SL / G Plan Apo Optical tube Siedentopf, adjustable interpupillary distance range: 51 - 76mm Focus adjust 50mm travel range with concentric coarse (3.8mm/rev) and fine (0.1mm/rev) focusing wheels (right / left)
Field number 24mm