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Equipped to measure a variety of parameters. A precision surface roughness tester supported by a wide range of optional accessories for a versatile benchtop surface-analysis solution.
• The analysis unit is equipped with the FORMTRACEPAK Surface Roughness / Contour analysis program.
• High-resolution type Z1-axis detector is provided as standard. The highest display
resolution of the Z1 axis is 0.0001μm (when the measuring range is 8μm.)
• X-axis drive unit is equipped with a builtin high-precision glass scale to achieve the highly accurate positioning for the travel direction (X axis). SV-3200 series employs a ceramic guide for the drive unit to enhance resistance to abrasion for a long service life.
• The resolution of the X axis is 0.05μm.
• Detectors with standard or low measuring force, 4mN or 0.75mN, are selectable whether the instrument is equipped with the inclinable drive unit or not.
• The 700mm Z2-axis (column) range models are new to the lineup.
Part Number |
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SV-3200W4 |
Part Number | Price | Name | Minimum Order Qty. | Volume Discount | Days to Ship | External dimensions (W×D×H) Main unit | Mass | Travel range of the X axis | Drive unit X-axis straightness | Drive unit (Z2 axis) (column) |
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฿ 999,999,999.00 | SURFTEST SV-3200 SERIES 178 | 1 Piece(s) | 95 Day(s) | 1156×482×1176mm | 220kg | 100mm | (0.05+0.001L)µm (L: Measuring length (mm)) | 500mm (motorized) |
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Assessed profile | Primary profile, Roughness profile, Waviness profile, Filtered waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile / Envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile | Parameter | Pa, Pq, Psk, Pku, Pp, Pv, Pz, P t, Pc, PSm, PΔq, Pm (rc), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rm (rc), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wm (rc), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW | Analysis graph | ADC, BAC, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart / Slope distribution chart, Local peak distribution chart, Parameter distribution chart |
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Data compensation functions | Tilt compensation (General/First half/Second half/Anchor/Arbitrary), R-surface compensation, Ellipse compensation / Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation | Filter | Gaussian, 2CR75 / 2C R50 / 2CRPC75 / 2CRPC50 / Robust-Spline | Cutoff value (λs) | 0.0008mm / 0.0025mm / 0.008mm / 0.025mm / 0.08mm / 0.25mm / 0.8mm |
Cutoff value (λc) | 0.025mm / 0.08mm / 0.25mm / 0.8mm / 2.5mm / 8mm / 25mm, arbitrary (0.025 to 50mm) | Cutoff value (λf) | 0.08mm / 0.25mm / 0.8mm / 2.5mm / 8mm / 25mm / 80mm, arbitrary (0.025 to 50mm) | Sampling length | 0.025mm / 0.08mm / 0.25mm / 0.8mm / 2.5mm / 8mm / 25mm, arbitrary (0.025 to 50mm) |
Recording Vertical magnification | 10X to 500,000X, Auto | Recording Horizontal magnification | 0.5X to 10,000X, Auto | Detection method | Differential inductance |
Detector Stylus & Measuring force | 0.75mN stylus tip (cone): Tip taper angle: 60°, Tip radius: 2μm / 4mN stylus tip (cone): Tip taper angle: 90°, Tip radius: 5μm | Measuring range/Resolution (Z1 axis) | 800μm/0.01μm, 80μm/0.001μm, 8μm/0.0001μm | Drive unit Measuring speed | 0.02mm/s / 0.05mm/s / 0.1mm/s / 0.2mm/s / 0.5mm/s / 1.0mm/s / 2.0mm/s / 5.0mm/s / 10mm/s / 20mm/s |
Cutoff value (λh) | 0.025mm / 0.08mm / 0.25mm / 0.8mm / 2.5mm / 8mm, arbitrary (0.025 to 50mm) | Cutoff value (λl) | 0.08mm / 0.25mm / 0.8mm / 2.5mm / 8mm / 25mm, arbitrary (0.025 to 50mm) | Power supply Measuring main unit | 100V 50/60Hz |
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