MF-U series SERIES 176 — Universal Measuring Microscopes

• Observation with a clear and flareless erect image and a wide field of view.
• Measuring accuracy is the highest in its class (and conforms to JIS B 7153).
• Proven high-NA objectives from the FS optical system (long working distance type).
• Integration of metallurgical and measurement microscope functions provide high-resolution observation and a high-accuracy measurement solutions.
• Illumination unit (reflected/transmitted) can be selected from a high-intensity LED or halogen bulb (required).
• Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction.
• Variety of standardized stages in sizes up to 400×200mm.
• Quick-release mechanism useful for moving the stage quickly.
• Coarse/fine feed handles are standard on both sides allowing precise focus and observation measurement regardless of handedness.
• High-magnification observation up to 4000X.