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Product DetailSpecification/Dimensions
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type
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Measuring Force(N)
- Surface roughness measurement:0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2") / Contour: 10, 20, 30, 40, 50mN (switching on the software)
- Surface roughness measurement:0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2") / Contour: 30mN (adjustment using weights)
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X1 Axis Accuracy (20°C)
- Contour: ±(0.8+0.01L)μm L: traverse length (mm)
- Contour: ±(0.8+0.02L)μm L = traverse length (mm)
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Z1 Axis (Detector) Resolution (with standard stylus)
- Surface roughness measurement: 0.01μm (800μm), 0.001μm (80μm), 0.0001μm (8μm) / Contour: 0.02µm
- Surface roughness measurement: 0.01μm (800μm), 0.001μm (80μm), 0.0001μm (8μm) / Contour: 0.04µm
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Z1 Axis (Detector) Accuracy (20°C)
- ±(0.8+|2H|/100)μm
- ±(1.4+|2H|/100)μm
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X1 Axis (Drive unit) Straightness - Contour
- 0.8μm/100mm
- 2µm/200mm
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Z1 Axis (Detector) Accuracy (20°C) - Contour
- ±(0.8+|2H|/100)μm, H: Probing height from the horizontal (mm)
- ±(1.4+|2H|/100)μm, H: Probing height from the horizontal (mm)
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X Axis Measuring range
- 100mm
- 200mm
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Z2 axis (column) travel range
- 300mm
- 500mm
- 700mm
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Straightness
- (0.05+L /1000) μm L: traverse length (mm)
- (0.1+0.002L) μm L: traverse length (mm)
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Face of stylus
- Vertical direction (up/down, available for continuous measurement)
- Vertical direction (up/down, single measurement)
Days to Ship
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- All
- 95 Day(s) or Less
Specify Alterations
Formtracer SV-C3200/4500 SERIES 525 — Surface Roughness and Contour Measuring Systems (SV-C3200W8)
FORMTRACER
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Product DetailProduct Description
• The combination of a surface roughness tester and contour measuring instrument saves installation space.
Surface roughness testing function
• Z1-axis detector provides highest resolution of 0.0001μm (when the measuring range is 8μm) is
provided as standard.
• High-accuracy glass scales, built-in on the X axis, directly read the drive unit movement. Greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning.
• Measuring force for the detector is selectable from 4mN or 0.75mN. Contour measuring function
• The Z1 axis (detector) is equipped with a highprecision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.
• The following two features have been added exclusively for the SV-C-4500 series as functions
dedicated to contour measuring systems.
(1) Continuous measurement in the vertical direction (up/down) is available in combination with a doubletipped stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.
(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.
• The 700mm Z2-axis (column) range models are new to the lineup.
| Part Number |
|---|
| SV-C3200W8 |
| Part Number | Price | Name | Minimum Order Qty. | Volume Discount | Days to Ship | Measuring Force (N) | X1 Axis Accuracy (20°C) | Z1 Axis (Detector) Resolution (with standard stylus) | Z1 Axis (Detector) Accuracy (20°C) | X1 Axis (Drive unit) Straightness - Contour | Z1 Axis (Detector) Accuracy (20°C) - Contour | X Axis Measuring range | Z2 axis (column) travel range | Straightness | Face of stylus |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
฿ 999,999,999.00 | FORMTRACER | 1 Piece(s) | 95 Day(s) | Surface roughness measurement:0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2") / Contour: 30mN (adjustment using weights) | Contour: ±(0.8+0.02L)μm L = traverse length (mm) | Surface roughness measurement: 0.01μm (800μm), 0.001μm (80μm), 0.0001μm (8μm) / Contour: 0.04µm | ±(1.4+|2H|/100)μm | 2µm/200mm | ±(1.4+|2H|/100)μm, H: Probing height from the horizontal (mm) | 200mm | 500mm | (0.1+0.002L) μm L: traverse length (mm) | Vertical direction (up/down, single measurement) |
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Basic Information
| Product Model | Measurement element | Specification | Stylus tip shape: 60°, 2μmR (when the Code No. of the main unit ends with "-1") / 90°, 5μmR (when the Code No. of the main unit ends with "-2") | X1 Axis Resolution | 0.05 µm |
|---|---|---|---|---|---|
| Z2 Axis (Column) Resolution | Contour: 1 µm | Z1 Axis (Detector) Measuring range - Contour | 60mm (±30mm from the horizontal) | Z1 Axis (Detector) Measuring Range | 800μm/80μm/8μm |
| Measuring speed | 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20mm/s | Drive speed | X axis: 0 to 80mm/s or manual operation, Z2 axis (column): 0 to 30mm/s or manual operation | Applicable standards | JIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDA |
| Parameter | Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P q, Pmr (C), Pmr, P c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R q, Rmr (C), Rmr, R c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W q, Wmr(C), Wmr, W c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, Ir, a, a, q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW | Assessed profile | Primary profile, Roughness profile, Filtered waviness profile, Waviness profile, Rolling circle waviness primary profile, Rolling circle waviness profile, Envelope residual profile, DF profile (DIN4776/ ISO13565-1), Roughness motif (Envelope waviness profile is displayed when evaluating the motif.) | Analysis graph | Material ratio curve, Profile height amplitude distribution curve, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart (Contour analysis function can analyze the area of abrasion amount and overlay.) |
| Data compensation functions | Least squares straight line, R-surface compensation, Ellipse compensation, Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation (auto or arbitrary 2nd to 7th), No compensation | Filter | Gaussian filter, 2CRPC75, 2CRPC50, 2CR75, 2CR50, Robust spline filter | X axis Inclination range | ±45° |
- The specifications and dimensions of some parts may not be fully covered. For exact details, refer to manufacturer catalogs .
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