Formtracer SV-C3200/4500 SERIES 525 — Surface Roughness and Contour Measuring Systems

• The combination of a surface roughness tester and contour measuring instrument saves installation space.
Surface roughness testing function
• Z1-axis detector provides highest resolution of 0.0001μm (when the measuring range is 8μm) is
provided as standard.
• High-accuracy glass scales, built-in on the X axis, directly read the drive unit movement. Greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning.
• Measuring force for the detector is selectable from 4mN or 0.75mN. Contour measuring function
• The Z1 axis (detector) is equipped with a highprecision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.
• The following two features have been added exclusively for the SV-C-4500 series as functions
dedicated to contour measuring systems.
(1) Continuous measurement in the vertical direction (up/down) is available in combination with a doubletipped stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.
(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.
• The 700mm Z2-axis (column) range models are new to the lineup.