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Surftest SJ-500P/SV-2100M4 Data Processing Unit (PC) Surface Roughness Testers

SURFTEST

Surftest SJ-500P/SV-2100M4 Data Processing Unit (PC) Surface Roughness Testers
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Product Description

Highly precise, high-performance surface roughness testers that use the advantages of sophisticated
analysis software. The SJ-500P is a stand-alone instrument whereas the SV-2100M4 is a benchtop
machine incorporating a precision column with manual drive.
• Simple setup for surface roughness measuring conditions. A simple input function is used to calculate
according to ISO/JIS roughness standard drawing instruction symbols. Complicated measuring condition settings can easily be entered by selecting a drawing instruction symbol from the surface roughness menu.

Part Number
SJ-500P
Part NumberPriceNameMinimum Order Qty.Volume DiscountDays to Ship

฿ 999,999,999.00

SURFTEST 1 Piece(s) 95 Day(s)

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Basic Information

Type of data processing unit PC type Measuring range (X axis) 50mm Measuring range (Z1 axis) (detector) 800μm / 80μm / 8μm
Resolution (X axis) 0.05μm Resolution (Z1 axis) (detector) 0.01μm(800μm) / 0.001μm(80μm) / 0.0001μm(8μm) Drive speed (X axis) 0 to 20mm/s or manual operation
Measuring speed 0.02 / 0.05 / 0.1 / 0.2 / 0.5 / 1.0 / 2.0 / 5.0mm/s Straightness 0.2μm / 50mm X-axis operation From PC/ with manual knob
Measuring force/Stylus tip angle, Radius Depends on the Code No.: 0.75mN/60°, 2μm (when the Code No. ends with "-01") / 4mN/90°, 5μm (when the Code No. ends with "-02") Applicable standards JIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDA Assessed profile Primary profile, Roughness profile, Waviness profile, Filtered waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile, Envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile
Parameter Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pm(r c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rm(r c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wm(r c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW Analysis graph ADC, BAC, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart Data compensation functions Tilt compensation (General/First half/Second half/Anchor/Arbitrary), R-surface compensation, Ellipse compensation / Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation
Contour analysis function When using SURFPAK-EZ: Step, Circle, Angle, Area, Coordinate difference Filter Gaussian, 2CR75 / 2CR50 / 2CRPC75 / 2CRPC50 / Robust-Spline External dimensions (W×D×H) Main unit 425×94 ×160mm
External dimensions (W×D×H) PC I/F Unit 350×263×86mm Mass (Main unit) 2.7 kg Mass PC I/F Unit 3.8 kg