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Highly precise, high-performance surface roughness testers that use the advantages of sophisticated
analysis software. The SJ-500P is a stand-alone instrument whereas the SV-2100M4 is a benchtop
machine incorporating a precision column with manual drive.
• Simple setup for surface roughness measuring conditions. A simple input function is used to calculate
according to ISO/JIS roughness standard drawing instruction symbols. Complicated measuring condition settings can easily be entered by selecting a drawing instruction symbol from the surface roughness menu.
Type of data processing unit | PC type | Measuring range (X axis) | 50mm | Measuring range (Z1 axis) (detector) | 800μm / 80μm / 8μm |
---|---|---|---|---|---|
Resolution (X axis) | 0.05μm | Resolution (Z1 axis) (detector) | 0.01μm(800μm) / 0.001μm(80μm) / 0.0001μm(8μm) | Drive speed (X axis) | 0 to 20mm/s or manual operation |
Measuring speed | 0.02 / 0.05 / 0.1 / 0.2 / 0.5 / 1.0 / 2.0 / 5.0mm/s | Straightness | 0.2μm / 50mm | X-axis operation | From PC/ with manual knob |
Measuring force/Stylus tip angle, Radius | Depends on the Code No.: 0.75mN/60°, 2μm (when the Code No. ends with "-01") / 4mN/90°, 5μm (when the Code No. ends with "-02") | Applicable standards | JIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDA | Assessed profile | Primary profile, Roughness profile, Waviness profile, Filtered waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile, Envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile |
Parameter | Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pm(r c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rm(r c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wm(r c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW | Analysis graph | ADC, BAC, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart | Data compensation functions | Tilt compensation (General/First half/Second half/Anchor/Arbitrary), R-surface compensation, Ellipse compensation / Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation |
Contour analysis function | When using SURFPAK-EZ: Step, Circle, Angle, Area, Coordinate difference | Filter | Gaussian, 2CR75 / 2CR50 / 2CRPC75 / 2CRPC50 / Robust-Spline | External dimensions (W×D×H) Main unit | 425×94 ×160mm |
External dimensions (W×D×H) PC I/F Unit | 350×263×86mm | Mass (Main unit) | 2.7 kg | Mass PC I/F Unit | 3.8 kg |
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